{"id":6364,"date":"2025-07-14T10:45:31","date_gmt":"2025-07-14T08:45:31","guid":{"rendered":"https:\/\/www.atesystem.cz\/reseni\/kontrola-v-polovodicovem-prumyslu\/"},"modified":"2026-01-28T05:53:16","modified_gmt":"2026-01-28T04:53:16","slug":"inspection-in-the-semiconductor-industry","status":"publish","type":"reseni","link":"https:\/\/www.atesystem.cz\/en\/solution\/inspection-in-the-semiconductor-industry\/","title":{"rendered":"Inspection in the semiconductor industry"},"excerpt":{"rendered":"<p>We have developed and implemented advanced systems for optical inspection of wafers, prediction of wafer breakage including control of correct wafer seating in lithography.<\/p>\n","protected":false},"featured_media":6347,"parent":0,"template":"","meta":{"_acf_changed":false},"reseni_kategorie":[65,57],"class_list":["post-6364","reseni","type-reseni","status-publish","has-post-thumbnail","hentry","reseni_kategorie-research-and-development-laboratories","reseni_kategorie-electronics-and-electrical-engineering"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/reseni\/6364","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/reseni"}],"about":[{"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/types\/reseni"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/media\/6347"}],"wp:attachment":[{"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/media?parent=6364"}],"wp:term":[{"taxonomy":"reseni_kategorie","embeddable":true,"href":"https:\/\/www.atesystem.cz\/en\/wp-json\/wp\/v2\/reseni_kategorie?post=6364"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}